The influence of cathode thickness and aging on the photoelectric yields of LiF and CsI in the xuv
Appl Opt
.
1966 Aug 1;5(8):1338-9.
doi: 10.1364/AO.5.001338.
Authors
L Heroux
,
W J McMahon
,
H E Hinteregger
PMID:
20057543
DOI:
10.1364/AO.5.001338
No abstract available
Publication types
Letter