High-fidelity transport of trapped-ion qubits through an X-junction trap array

Phys Rev Lett. 2009 Apr 17;102(15):153002. doi: 10.1103/PhysRevLett.102.153002. Epub 2009 Apr 16.

Abstract

We report reliable transport of (9)Be(+) ions through an "X junction" in a 2D trap array that includes a separate loading and reservoir zone. During transport the ion's kinetic energy in its local well increases by only a few motional quanta and internal-state coherences are preserved. We also examine two sources of energy gain during transport: a particular radio-frequency noise heating mechanism and digital sampling noise. Such studies are important to achieve scaling in a trapped-ion quantum information processor.