New epitaxial phase transition between DG and HEX in PS-b-PI

Hae-Woong Park; Jueun Jung; Taihyun Chang; Kazuyuki Matsunaga; Hiroshi Jinnai

doi:10.1021/ja808259m

New epitaxial phase transition between DG and HEX in PS-b-PI

J Am Chem Soc. 2009 Jan 14;131(1):46-7. doi: 10.1021/ja808259m.

Authors

Hae-Woong Park¹, Jueun Jung, Taihyun Chang, Kazuyuki Matsunaga, Hiroshi Jinnai

Affiliation

¹ Department of Chemistry and Polymer Research Institute, Pohang University of Science and Technology, Pohang, 790-784, Korea.

PMID: 19072158
DOI: 10.1021/ja808259m

Abstract

We investigated the epitaxial phase transition from double gyroid (DG) to hexagonally packed cylinder (HEX) phases of a polystyrene-b-polyisoprene diblock copolymer in a thin film on a Si wafer substrate. The internal structure of the thin film was investigated by grazing incidence small-angle X-ray scattering, transmission electron microscopy, and transmission electron microtomography (TEMT). TEMT allows observation of the 3D-image of coexisting DG and HEX directly. Good domain orientation in the thin film and direct 3D-imaging of TEMT made it possible to observe the coexisting phase of DG and HEX, and a new epitaxial transition path from DG to HEX was found.