An all-metallic logic gate based on current-driven domain wall motion

Nat Nanotechnol. 2008 Feb;3(2):97-100. doi: 10.1038/nnano.2008.1. Epub 2008 Feb 3.

Abstract

The walls of magnetic domains can become trapped in a ferromagnetic metallic point contact when the thickness of the film and the width of the contact are less than their critical values. The discovery that domain walls can be moved from such constrictions by a sufficiently large current has attracted considerable attention from researchers working on both fundamental research and potential applications. Here we show that Invar nanocontacts fabricated on silica substrates exhibit a sharp drop in resistance with increasing bias voltage at room temperature in the absence of an applied magnetic field. Moreover, when two nanocontacts are combined in an all-metallic comparison circuit, it is possible to perform logical NOT operations. The use of electrical currents rather than applied magnetic fields to control the domain walls also reduces energy consumption and the risk of crosstalk in devices.

Publication types

  • Letter
  • Research Support, Non-U.S. Gov't

MeSH terms

  • Crystallization / methods*
  • Electric Conductivity
  • Electromagnetic Fields
  • Equipment Design
  • Equipment Failure Analysis
  • Macromolecular Substances / chemistry
  • Materials Testing
  • Microelectrodes*
  • Molecular Conformation
  • Nanostructures / chemistry*
  • Nanostructures / ultrastructure
  • Nanotechnology / instrumentation*
  • Particle Size
  • Signal Processing, Computer-Assisted / instrumentation*
  • Surface Properties

Substances

  • Macromolecular Substances