Using transmission and reflection measurements under normal incidence in one and three layers of a mum-scale metamaterial consisting of pairs of short-slabs and continuous wires, fabricated by a photolithography procedure, we demonstrate the occurrence of a negative refractive index regime in the far infrared range, ~2.4-3 THz. The negative index behavior in that system at ~2.4-3 THz is further confirmed by associated simulations, which are in qualitative agreement with the experimental results.