The detectability of wavelength-modulation (WM) diode-laser spectrometric techniques is frequently limited by various background signals. A new theoretical formalism for WM spectrometry, based on Fourier analysis and therefore capable of handling a variety of phenomena including the characterization and the analysis of analytical as well as background WM signals, was recently presented [Appl. Opt. 38, 5803 (1999)]. We report a detailed characterization of WM background signals from multiple reflections between pairs of surfaces in the optical system that act as etalons and from the associated intensity modulation in terms of this new formalism. The agreement between the background signals from a thin glass plate and those predicted by the formalism is good, which verifies the new Fourier analysis-based formalism.