Scanning near-field optical microscopy signal processing and resolution

Appl Opt. 2007 Apr 20;46(12):2248-55. doi: 10.1364/ao.46.002248.

Abstract

To increase the signal-to-noise ratio and to remove the spatially slow varying signals, a lock-in amplifier is often used in scanning probe microscopy. The signal reconstructed from the lock-in data contains the contributions of the evanescent and homogeneous waves that are mixed in the near-field zone (i.e., at a very short distance). The resolution is determined and a method is given to suppress the useless background information. Experimental images of nanoparticles are processed.

Publication types

  • Evaluation Study

MeSH terms

  • Algorithms*
  • Image Enhancement / methods*
  • Image Interpretation, Computer-Assisted / methods*
  • Information Storage and Retrieval / methods
  • Microscopy, Scanning Probe / methods*
  • Nanostructures / ultrastructure*
  • Reproducibility of Results
  • Sensitivity and Specificity
  • Signal Processing, Computer-Assisted*