Electron diffraction analysis of individual single-walled carbon nanotubes

Ultramicroscopy. 2006 Feb;106(3):176-90. doi: 10.1016/j.ultramic.2005.07.008. Epub 2005 Aug 15.

Abstract

We present a detailed electron diffraction study of individual single-walled carbon nanotubes. A novel sample preparation procedure provides well-separated, long and straight individual single-shell nanotubes. Diffraction experiments are carried out at 60 kV, below the threshold for knock-on damage in carbon nanotubes. We describe experimental parameters that allow single-tube electron diffraction experiments with widely available thermal emission transmission electron microscopes. Further, we review the simulation of diffraction patterns for these objects.