Atomic imaging in EBCO superconductor films by an X-ray holography system using a toroidally bent graphite analyzer

J Synchrotron Radiat. 2005 Jul;12(Pt 4):530-3. doi: 10.1107/S0909049505006497. Epub 2005 Jun 15.

Abstract

X-ray fluorescence holography (XFH) is a new technique enabling the determination of the three-dimensional local atomic structure around a certain element. This method has been applied to analyze the local structure around Cu in 300 nm thin films of EuBa(2)Cu(3)O(7-delta) (EBCO) epitaxially grown on MgO (100) substrate, using the newest system for XFH measurement and high-brilliance synchrotron radiation at SPring-8. Here, the results of a study on the irradiation effect on the local atomic structure of EBCO superconductor with XFH measurements are presented.

Publication types

  • Evaluation Study
  • Research Support, Non-U.S. Gov't

MeSH terms

  • Crystallography / instrumentation*
  • Crystallography / methods*
  • Electric Conductivity
  • Equipment Design
  • Equipment Failure Analysis
  • Europium / analysis*
  • Europium / chemistry*
  • Holography / instrumentation*
  • Holography / methods*
  • Membranes, Artificial
  • Molecular Conformation
  • Spectrometry, X-Ray Emission / instrumentation*
  • Spectrometry, X-Ray Emission / methods*

Substances

  • Membranes, Artificial
  • Europium