Improving the performance of high-resolution X-ray spectrometers with position-sensitive pixel detectors

J Synchrotron Radiat. 2005 Jul;12(Pt 4):467-72. doi: 10.1107/S0909049505010630. Epub 2005 Jun 15.

Abstract

A dispersion-compensation method to remove the cube-size effect from the resolution function of diced analyzer crystals using a position-sensitive two-dimensional pixel detector is presented. For demonstration, a resolution of 23 meV was achieved with a spectrometer based on a 1 m Rowland circle and a diced Si(555) analyzer crystal in a near-backscattering geometry, with a Bragg angle of 88.5 degrees . In this geometry the spectrometer equipped with a traditional position-insensitive detector provides a resolution of 190 meV. The dispersion-compensation method thus allows a substantial increase in the resolving power without any loss of signal intensity.

Publication types

  • Comparative Study
  • Evaluation Study
  • Validation Study

MeSH terms

  • Equipment Design
  • Equipment Failure Analysis
  • Signal Processing, Computer-Assisted / instrumentation*
  • Spectrometry, X-Ray Emission / instrumentation*
  • Spectrometry, X-Ray Emission / methods
  • Transducers*
  • X-Ray Diffraction / instrumentation*
  • X-Ray Diffraction / methods