The palladium(II)-substituted tungstosilicate [Cs(2)K(H(2)O)(7)Pd(2)WO(H(2)O)(A-alpha-SiW(9)O(34))(2)](9)(-) (1) has been synthesized and characterized by IR, elemental analysis, and electrochemistry. Single-crystal X-ray analysis was carried out on Cs(3)K(2)Na(4)[Cs(2)K(H(2)O)(7)Pd(2)WO(H(2)O)(A-alpha-SiW(9)O(34))(2)].5H(2)O (1a), which crystallizes in the monoclinic system, space group P2(1)/n, with a = 16.655(3) A, b = 19.729(4) A, c = 25.995(5) A, beta = 95.46(3) degrees , and Z = 4. Polyanion 1represents the first structurally characterized palladium(II)-substituted tungstosilicate. The title polyanion consists of two (A-alpha-SiW(9)O(34)) Keggin moieties linked via a [WO(H(2)O)](4+) group and two equivalent, square-planar Pd(2+) ions leading to a sandwich-type structure with C(2)(v) symmetry. The central belt of 1 contains also one potassium and two cesium ions. Polyanion 1 was synthesized by reaction of Pd(CH(3)COO)(2) with K(10)[A-alpha-SiW(9)O(34)] in aqueous acidic medium (pH 4.8). A cyclic voltammetry study of polyanion 1 in a pH 5 medium shows a Pd(0) deposition process on the glassy carbon electrode surface. The corresponding wave and that of tungsten redox processes could be separated clearly during the first few runs before their merging into a broad composite wave. The film thickness increases with the number of potential cycles or the duration of potentiostatic electrolysis. As judged from hydrogen sorption/desorption pattern, the quality of the film deposited from polyanion 1 is better than that of a film deposited directly from Pd(2+) solutions.