The effect of the signal-to-noise ratio in CBED patterns on the accuracy of lattice parameter determination

J Electron Microsc (Tokyo). 2004;53(3):237-44. doi: 10.1093/jmicro/53.3.237.

Abstract

A method of higher-order Laue zone line position measurement in convergent-beam electron diffraction (CBED) is proposed based on Hough transformation. A thorough analysis of the errors introduced by this measurement procedure is performed and their influence on the accuracy of lattice parameter determination is estimated. A criterion is derived which enables the accuracy to be predicted before experimental measurements are made and, thus, allows the selection of the best CBED geometry for parameter measurement.

Publication types

  • Research Support, Non-U.S. Gov't

MeSH terms

  • Algorithms*
  • Crystallography
  • Image Processing, Computer-Assisted*
  • Microscopy, Electron, Scanning / methods*