Monolayer films adsorbed on substrates with high refractive indices such as metals or semiconductors yield strongly enhanced infrared reflection spectra when they are contacted with a transparent, high refractive index ambient medium and are probed with p-polarized light at high incidence angles. The sensitivity increase arises from the enhancement of the perpendicular electric field within a thin, low refractive index layer sandwiched between two high refractive index materials and gives rise to signal intensity gains up to 2 orders of magnitude in combination with an essentially exclusive detection of only perpendicular surface vibrations. Experimental spectra of ordered monolayer films of octadecanethiol on gold and of octadecylsiloxane on silicon in this sandwich configuration yield enhancement factors between 15 (on Si) and 30 (on gold) compared to conventional grazing incidence external reflection spectra and are governed by a common, simple surface selection rule, which allows immediate quantitative evaluation and comparison of the film structures on different substrates.