Long-lived charge-separated state leading to DNA damage through hole transfer

Kiyohiko Kawai; Tadao Takada; Takayoshi Nagai; Xichen Cai; Akira Sugimoto; Mamoru Fujitsuka; Tetsuro Majima

doi:10.1021/ja038309g

Long-lived charge-separated state leading to DNA damage through hole transfer

J Am Chem Soc. 2003 Dec 31;125(52):16198-9. doi: 10.1021/ja038309g.

Authors

Kiyohiko Kawai¹, Tadao Takada, Takayoshi Nagai, Xichen Cai, Akira Sugimoto, Mamoru Fujitsuka, Tetsuro Majima

Affiliation

¹ The Institute of Scientific and Industrial Research (SANKEN), Osaka University, Mihogaoka 8-1, Ibaraki, Osaka 567-0047, Japan. kiyohiko@sanken.osaka-u.ac.jp

PMID: 14692755
DOI: 10.1021/ja038309g

Abstract

The hole transfer causes the long-lived charge-separated state in DNA during the photosensitized one-electron oxidation of DNA. The combination of the transient absorption measurement and DNA damage quantification by HPLC clearly demonstrated that the yield of the DNA damage correlates well with the lifetime of the charge-separated state.

Publication types

Research Support, Non-U.S. Gov't

MeSH terms

Chromatography, High Pressure Liquid
DNA / chemistry*
DNA / drug effects
DNA / radiation effects
DNA Damage*
Imides / chemistry
Imides / pharmacology
Oligonucleotides / chemistry
Oligonucleotides / radiation effects
Oxidation-Reduction
Photolysis
Photosensitizing Agents / chemistry
Photosensitizing Agents / pharmacology

Substances

Imides
Oligonucleotides
Photosensitizing Agents
DNA