Analysis of the rutile-ring method of frequency-temperature compensating a high-Q whispering gallery sapphire resonator

M E Tobar; J G Hartnett; G Duchiron; D Cros; E N Ivanov; P Blondy; P Guillon

doi:10.1109/58.920715

Analysis of the rutile-ring method of frequency-temperature compensating a high-Q whispering gallery sapphire resonator

IEEE Trans Ultrason Ferroelectr Freq Control. 2001 May;48(3):812-20. doi: 10.1109/58.920715.

Authors

M E Tobar¹, J G Hartnett, G Duchiron, D Cros, E N Ivanov, P Blondy, P Guillon

Affiliation

¹ Department of Physics, University of Western Australia, Nedlands 6903, WA, Australia. mike@physics.uwa.edu.au

PMID: 11381706
DOI: 10.1109/58.920715

Abstract

The rutile-ring method of dielectrically frequency-temperature compensating a high-Q whispering gallery (WG) sapphire resonator is presented. Two and three-dimensional finite element (FE) analysis has been implemented to design and analyze the performance of such resonators, with excellent agreement between theory and experiment. A high-Q factor of 30 million at 13 GHz and compensation temperature of 56 K was obtained. It is shown the frequency-temperature compensation can occur either because the rutile adds a small perturbation to the sapphire resonator or because of a mode interaction with a resonant mode in the rutile. The characteristics of both of these methods are described, and it is shown that for high frequency stability, it is best to compensate perturbatively.