Proximal electromagnetic shear forces

J Microsc. 1999 Oct;196(1):59-60. doi: 10.1046/j.1365-2818.1999.00596.x.

Abstract

We perform a simple model calculation to estimate the electromagnetically induced shear force caused by a current dissipation when a charged tip is moved parallel to a conducting material. For parameters typical in shear force imaging, the force is many orders of magnitude below reported values. Thus, proximal electromagnetic tip-sample forces can be neglected in discussions of shear force imaging.